Compact TCT (Conventional/Educational)

The conventional TCT is na ideal tool for investigation of semiconductor material properties. The beam spot is around 1 mm wide and is ideal for pad-detector studies. Different wavelengths can be selected ranging from 404 nm to 1064 nm. The sensor is mounted on the Peltier element (air cooled), which allows for measurements in the range from -5C to 60C (depends on the ambinet temperature). The system is very lightweigth and portable and is also ideal for studying the semiconductor properties at laboratory courses. A special set of samples can be provided for this use.

Component Parameter Properties
Laser diode
wavelength: 404nm - 1064 nm (see lasers tab)
pulse power: few m.i.p. - 100 m.i.p. (equivalent in 300 micron Si)
pulse width: <350 ps - 4000 ps (tunable)
coupling: open - beam width in waist of ~1 mm
control: with PC over USB
running mode: single pulse: 50 Hz - 1MHz
patter mode: mHz to 100 kHZ
1024 bits deep sequence of pulses
minimum distance between two pulses 440 ns
external control: external NIM logical signal
I/O: ext. trigger in/trigger out MC/trigger out laser
positioning: manual
amplifier: 33 dB
Bias-T range: >1000 V
frequency range: <0.3 MHz->3000 MHz
Mounting brackets
cooling type: Peltier element
heat remover: air fan
cooling power: 40W (dT~30C)
test sample box: 2.5x3 cm2 - other sizes optional
mounting plane: 5 cm x5 cm
Full DAQ: adaptation for specific oscilloscope, power source on demand
analysis software: root based package